Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Editor: Finn E. Christensen |
Title | X-Ray Multilayers for Diffractometers, Monochromators, and Spectrometers: 17-19 August 1988, San Diego, California |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 1988 |
Languages | eng |
Isbn | 081940019X |
Series | SPIE Proceedings |
Volume | 984 |
Description | viii, 271 p. ill. 28 cm. |
Record date | 20130906 |
Location | Bellingham, Wash. |