| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: Finn E. Christensen |
| Title | X-Ray Multilayers for Diffractometers, Monochromators, and Spectrometers: 17-19 August 1988, San Diego, California |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1988 |
| Languages | eng |
| Isbn | 081940019X |
| Series | SPIE Proceedings |
| Volume | 984 |
| Description | viii, 271 p. ill. 28 cm. |
| Record date | 20130906 |
| Location | Bellingham, Wash. |