| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: Michel Grosmann, Patrick Meyrueis |
| Title | First European Conference on Optics Applied to Metrology: October 26-28, 1977, Strasbourg (France) |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1978 |
| Languages | eng |
| Isbn | 0892521635 |
| Series | SPIE Proceedings |
| Volume | 136 |
| Issn | 1047-9899 |
| Description | viii, 376 p. 28 cm. |
| Record date | 20130824 |
| Location | Bellingham, Wash. |