| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Silvano Fineschi |
| Title | X-Ray and Ultraviolet Spectroscopy and Polarimetry: 28-29 July 1994, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1994 |
| Languages | eng |
| Isbn | 081941607X |
| Series | SPIE Proceedings |
| Volume | 2283 |
| Description | 300 s. |
| Record date | 20090727 |
| Location | Bellingham, Wash., USA |
| Keywords | Polarimetry, Ultraviolet engineering, Röntgenspektroskopi, X-ray astronomy, Spektroskopi, Spectroscopy, Konferenspublikationer, Conference proceedings |