| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Donald P. D'Amato, Wolf-Ekkehard Blanz, Byron E. Dom, Sargur N. Srihari |
| Title | Machine Vision Applications in Character Recognition and Industrial Inspection: 10-12 February 1992, San Jose, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1992 |
| Languages | eng |
| Isbn | 0819408158 |
| Series | SPIE Proceedings |
| Volume | 1661 |
| Issn | 99-0108644 |
| Description | vii, 431 s. |
| Record date | 20100810 |
| Location | Bellingham, Wash., USA |
| Keywords | Integrated circuits inspection, Seende datorer, Computer vision, Optisk mönsteridentifiering, Optical pattern recognition, Optisk teckenigenkänning (Datorer), Optical character recognition (Computers), Konferenspublikationer, Conference proceedings |