| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Robert Lee Murrer Jr. |
| Title | Technologies for Synthetic Environments: Hardware-in-the-Loop Testing: 9-11 April 1996, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1996 |
| Languages | eng |
| Isbn | 0819421227 |
| Series | SPIE Proceedings |
| Volume | 2741 |
| Description | 448 s. |
| Record date | 20090728 |
| Location | Bellingham, Wash., USA |
| Keywords | Fjärranalys, Remote sensing, Vapenteknik, Weaponry |