Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Editors: Ernst-Echard Koch, Günter Schmahi |
Title | Soft X-Ray Optics and Technology: 8-11 December 1986, Berlin, Federal Republic of Germany |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 1987 |
Languages | eng |
Isbn | 0892527684 |
Series | SPIE Proceedings |
Volume | 733 |
Description | x, 546 p. ill. 28 cm. |
Record date | 20130901 |
Location | Bellingham, Wash. |