| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Maksymilian Pluta, Mariusz Szyjer |
| Title | Refractometry: 16-20 May 1994, Warsaw, Poland |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819417068 |
| Series | SPIE Proceedings |
| Volume | 2208 |
| Issn | 99-0108644 |
| Description | 228 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Refraction, Refractometry, Reflectometry, Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |