Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Maksymilian Pluta, Mariusz Szyjer |
Title | Refractometry: 16-20 May 1994, Warsaw, Poland |
Publisher | SPIE Optical Engineering Press |
Year | 1995 |
Languages | eng |
Isbn | 0819417068 |
Series | SPIE Proceedings |
Volume | 2208 |
Issn | 99-0108644 |
Description | 228 s. |
Record date | 20100813 |
Location | Bellingham, Wash., USA |
Keywords | Refraction, Refractometry, Reflectometry, Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |