| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Thomas W. Rusch |
| Title | X Rays in Materials Analysis: Novel Applications and Recent Developments: 21-22 August 1986, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1986 |
| Languages | eng |
| Isbn | 0892527250 |
| Series | SPIE Proceedings |
| Volume | 690 |
| Description | vi, 156 p. ill. 28 cm. |
| Record date | 20090824 |
| Location | Bellingham, Wash., USA |
| Keywords | Nondestructive testing, X-ray spectroscopy, Materials |