| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | J. Ebbeni |
| Title | Industrial Applications of Holographic Nondestructive Testing: May 3-5, 1982, Brussels |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1982 |
| Languages | eng |
| Isbn | 0892523840 |
| Series | SPIE Proceedings |
| Volume | 349 |
| Description | vi, 199 p. ill. 28 cm. |
| Record date | 20090717 |
| Location | Bellingham, Wash. |
| Keywords | Holographic testing |