Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Jose Cruz |
Title | Effective Utilization of Optics in Quality Assurance: November 14-16, 1977, Arlington Heights, Illinois |
Publisher | SPIE Optical Engineering Press |
Year | 1978 |
Languages | eng |
Isbn | 0892521562 |
Series | SPIE Proceedings |
Volume | 129 |
Description | vi, 110 p. ill. 28 cm. |
Record date | 20090716 |
Location | Bellingham, Wash. |
Keywords | Quality control |