| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David P. Casasent, Tien-Hsin Chao |
| Title | Optical Pattern Recognition XI: 26-27 April 2000, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 2000 |
| Languages | eng |
| Isbn | 0819436690 |
| Series | SPIE Proceedings |
| Volume | 4043 |
| Description | 388 s. |
| Record date | 20090812 |
| Location | Bellingham, Wash., USA |