| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David P. Casasent, Tien-Hsin Chao |
| Title | Optical Pattern Recognition V: 5-6 April 1994, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1994 |
| Languages | eng |
| Isbn | 0819415413 |
| Series | SPIE Proceedings |
| Volume | 2237 |
| Issn | 99-0108644 |
| Description | 456 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Optisk mönsteridentifiering, Optical pattern recognition, Konferenspublikationer, Conference proceedings |