Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | David P. Casasent, Tien-Hsin Chao |
Title | Optical Pattern Recognition V: 5-6 April 1994, Orlando, Florida |
Publisher | SPIE Optical Engineering Press |
Year | 1994 |
Languages | eng |
Isbn | 0819415413 |
Series | SPIE Proceedings |
Volume | 2237 |
Issn | 99-0108644 |
Description | 456 s. |
Record date | 20100813 |
Location | Bellingham, Wash., USA |
Keywords | Optisk mönsteridentifiering, Optical pattern recognition, Konferenspublikationer, Conference proceedings |