| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Joachim E. Trümper, Bernd Aschenbach |
| Title | X-Ray Optics, Instruments, and Mission III: 27-29 March 2000, Munich, Germany |
| Publisher | SPIE Optical Engineering Press |
| Year | 2000 |
| Languages | eng |
| Isbn | 0819436372 |
| Series | SPIE Proceedings |
| Volume | 4012 |
| Description | 746 s. |
| Record date | 20090811 |
| Location | Bellingham, Wash., USA |