| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Toru Yoshizawa, Hideshi Yokota |
| Title | International Symposium on Polarization Analysis and Applications to Device Technology: 12-14 June 1996, Yokohama, Japan |
| Publisher | SPIE Optical Engineering Press |
| Year | 1996 |
| Languages | eng |
| Isbn | 0819422711 |
| Series | SPIE Proceedings |
| Volume | 2873 |
| Description | 350 s. |
| Record date | 20090729 |
| Location | Bellingham, Wash., USA |
| Keywords | Photopolarimeters, Polarizers, Birefringence, Teknisk optik, Applied optics |