Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | David P. Casasent, Tien-Hsin Chao |
Title | Optical Pattern Recognition IX: 14-15 April 1998, Orlando, Florida |
Publisher | SPIE Optical Engineering Press |
Year | 1998 |
Languages | eng |
Isbn | 0819428353 |
Series | SPIE Proceedings |
Volume | 3386 |
Issn | 99-0108644 |
Description | 402 s. |
Record date | 20100818 |
Location | Bellingham, Wash., USA |