| Shelfclass_id | 7.C |
| Sortkey | S/ SPIE MS 35 |
| Authors | Rajpal S. Sirohi |
| Title | Selected papers on speckle metrology |
| Publisher | SPIE Optical Engineering Press |
| Year | c1991 |
| Languages | eng |
| Isbn | 0819406384, 0819406392 |
| Series | SPIE Milestone Series |
| Volume | 35 |
| Description | (hardbound) (softbound) xviii, 668 p. ill. 28 cm |
| Record date | 20060817 |
| Location | Bellingham, Wash., USA |
| Keywords | Speckle metrology, Holographic interferometry |
| Notes | "A publication of SPIE--the International Society for Optical Engineering." |