| Shelfclass_id | 6.G |
| Sortkey | VLSI TEST |
| Authors | IEEE |
| Title | VLSI Test 1993: Eleventh Annual VLSI Test Symposium: Design, Test, and Application: Systems on Silicon: April 6-8, 1993, Atlantic City, New Jersey |
| Publisher | Institute of Electrical and Electronics Engineers |
| Year | 1993 |
| Languages | eng |
| Isbn | 0818638303 |
| Description | xiii, 365 p. 28 cm |
| Record date | 20110531 |
| Location | New York |