| Shelfclass_id | 6.G |
| Sortkey | VLSI TEST |
| Authors | IEEE |
| Title | VLSI Test 1992: 1992 IEEE VLSI Test Symposium, 10th Anniversary,: Design, Test, and Application: ASICs and SYSTEMS-ON-A-CHIP: April 7-9, 1992, Bally's Bark Place Casino Hotel, Atlantic City, New Jersey, USA |
| Publisher | Institute of Electrical and Electronics Engineers |
| Year | 1992 |
| Languages | eng |
| Isbn | 0780306244 |
| Description | xiv, 344 p. 28 cm |
| Record date | 20120222 |
| Location | New York |