| Shelfclass_id | 6.G |
| Sortkey | RAMS |
| Authors | Institute of Electrical and Electronics Engineers |
| Title | RAMS 1969: Proceedings of the 1969 Annual Symposium on Reliability: Chicago, Illinois, January 21-23, 1969: 2000 |
| Publisher | IEEE |
| Year | 1969 |
| Languages | eng |
| Issn | 0149-144X |
| Description | vii, 654 p. 27 cm |
| Record date | 20080908 |
| Location | New York |
| Notes | Annals of Assurance Sciences, Vol. 2, Number 1. |