Shelfclass_id |
6.G |
Sortkey |
RAMS |
Authors |
Institute of Electrical and Electronics Engineers |
Title |
RAMS 1995: Proceedings of the 1995 Annual Reliability and Maintainability Symposium: Washington, D.C., USA, January 16-19, 1995: 2000 |
Publisher |
IEEE |
Year |
1995 |
Languages |
eng |
Isbn |
0780324706 |
Series |
Annual Reliability and Maintainability Symposium |
Volume |
24 |
Issn |
0149-144X |
Description |
xx, 535, 101 p. 28 cm |
Record date |
20080908 |
Location |
New York |
Notes |
Theme: Reliability & Maintainability - The Next Generation. |