| Shelfclass_id | 6.G |
| Sortkey | RAMS |
| Authors | Institute of Electrical and Electronics Engineers |
| Title | RAMS 1970: Proceedings of the 1970 Annual Symposium on Reliability: Los Angeles, California, February 3-5, 1970: 2000 |
| Publisher | IEEE |
| Year | 1970 |
| Languages | eng |
| Issn | 0149-144X |
| Description | v, 539 p. 26 cm |
| Record date | 20080908 |
| Location | New York |
| Notes | Including 15 year cumulative index. Annals of Assurance Sciences, Vol. 3, Number 1. |