Shelfclass_id |
6.G |
Sortkey |
ITC |
Authors |
Institute of Electrical and Electronics Engineers. |
Title |
ITC 1983: International Test Conference 1983 Proceedings: Testing's Changing Role: October 18-20, 1983 |
Publisher |
IEEE Computer Society Press |
Year |
1983 |
Languages |
eng |
Isbn |
0818605022 |
Description |
xxv, 806 p. 28 cm. |
Record date |
20110509 |
Location |
Silver Spring, MD |
Keywords |
Integrated circuits, Testing, Electronic digital computers, Circuits, Automatic test equipment |
Notes |
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section |