Shelfclass_id |
6.G |
Sortkey |
ITC |
Authors |
Institute of Electrical and Electronics Engineers. |
Title |
ITC 1986: International Test Conference 1986 Proceedings: Testing's Impact on Design & Technology: September 8, 9, 10, 11, 1986 |
Publisher |
IEEE Computer Society Press |
Year |
1986 |
Languages |
eng |
Isbn |
0818607262 |
Description |
xxx, 1009 p. 28 cm. |
Record date |
20110509 |
Location |
Silver Spring, MD |
Keywords |
Integrated circuits, Testing, Electronic digital computers, Circuits, Automatic test equipment |
Notes |
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section |