| Shelfclass_id | 6.G |
| Sortkey | ITC |
| Authors | Institute of Electrical and Electronics Engineers |
| Title | ITC 1985: International Test Conference 1985 Proceedings: The Future of Test: November 19, 20, 21, 1985 |
| Publisher | IEEE Computer Society Press |
| Year | 1985 |
| Languages | eng |
| Isbn | 081860641 |
| Description | X xxx, 988 p. 28 cm. |
| Record date | 20110509 |
| Location | Silver Spring, MD |
| Keywords | Integrated circuits, Testing, Electronic digital computers, Circuits, Automatic test equipment |
| Notes | sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section |