| Shelfclass_id | 6.G |
| Sortkey | ITC |
| Authors | Institute of Electrical and Electronics Engineers. |
| Title | ITC 1984: International Test Conference 1984 Proceedings: The Three Faces of Test: Design, Characterization, Production: October 16, 17, 18, 1984 |
| Publisher | IEEE Computer Society Press |
| Year | 1984 |
| Languages | eng |
| Isbn | 0818605480 |
| Description | xxxi, 886 p. 28 cm. |
| Record date | 20110509 |
| Location | Silver Spring, MD |
| Keywords | Integrated circuits, Testing, Electronic digital computers, Circuits, Automatic test equipment |
| Notes | sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section |