| Shelfclass_id | 6.G |
| Sortkey | ITC |
| Authors | Institute of Electrical and Electronics Engineers. |
| Title | ITC 1980: 1980 Test Conference: Digest of Papers: Testing for the 80's: November 11, 12, 13, 1980 |
| Publisher | IEEE Computer Society Press |
| Year | 1980 |
| Languages | eng |
| Description | xv, 507 p. 28 cm |
| Record date | 20120302 |
| Location | Silver Spring, MD |
| Keywords | Integrated circuits, Testing, Electronic digital computers, Circuits, Automatic test equipment |