| Shelfclass_id | 6.G |
| Sortkey | FTCS |
| Authors | IEEE |
| Title | FTCS 1973: FTC/3: Digest of Papers: "The State of the Art: From Device Testing to Reconfigurable Systems": 73 International Symposium on Fault-Tolerant Computing 73: June 20 21 22 Palo Alto, Calif. |
| Publisher | IEEE |
| Year | 1973 |
| Languages | eng |
| Description | v, 182 p. 28 cm |
| Record date | 20120207 |
| Location | Piscataway, N.J. |