| Shelfclass_id | 6.G |
| Sortkey | ETC |
| Authors | IEEE, EUREL |
| Title | ETC 1993: Proceedings ETC 93 Third European Test Conference: Rotterdam, The Netherlands, April 19-22, 1993 |
| Publisher | IEEE Computer Society Press |
| Year | 1993 |
| Languages | eng |
| Isbn | 0818633603 |
| Description | xvi, 548 p. 28 cm |
| Record date | 20110623 |
| Location | Los Alamitos, Calif. |
| Keywords | Integrated circuits, Testing, Automatic test equipment |