Shelfclass_id |
6.G |
Sortkey |
DEFECT TOLERANCE |
Authors |
Editors: Fabrizio Lombardi, M. Sami, Y. Savaria, R. Stefanelli |
Title |
Defect Tolerance 1993: Proceedings, The IEEE International Workshop on Defect and Fault Tolerance on VLSI Systems: October 27-29, 1993, Venice, Italy |
Publisher |
Institute of Electrical and Electronics Engineers |
Year |
1993 |
Languages |
eng |
Isbn |
0818635029 |
Series |
Institute of Electrical and Electronics Engineers |
Issn |
1063-6722 |
Description |
xiii, 336 p. 24 cm |
Record date |
20110630 |
Location |
New York |