Shelfclass_id | 6.G |
Sortkey | CONVENTION |
Authors | IEEE Professional Technical Groups |
Title | Convention 1966 V10: 1966 IEEE International Convention Record: Part 10: Instruments; Measurements; Industrial Electronics; Nuclear Science; Ultrasonics: IEEE International Convention, New York, N.Y., March 21-25, 1966 |
Publisher | Institute of Electrical and Electronics Engineers |
Year | 1966 |
Languages | eng |
Description | ii, 191 p. 28 cm |
Record date | 20110530 |
Location | New York |