| Shelfclass_id | 6.G |
| Sortkey | CONVENTION |
| Authors | IEEE Professional Technical Groups |
| Title | Convention 1965 V11: 1965 IEEE International Convention Record: Part 11: Instruments; Measurements; Industrial Electronics; Nuclear Science; Ultrasonics: IEEE International Convention, New York, N.Y., March 22-26, 1965 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Year | 1965 |
| Languages | eng |
| Description | ii, 192 p. 28 cm |
| Record date | 20110530 |
| Location | New York |