Shelfclass_id | 6.G |
Sortkey | AUTOTESTCON |
Authors | Institute of Electrical and Electronics Engineers |
Title | Autotestcon 1983: AUTOTESTCON'83: International Automatic Testing Conference: "New Horizons in Automatic Testing": November 1, 2, 3: Hyatt Regency/Tarrant County Convention Center, Fort Worth, Texas |
Publisher | Institute of Electrical and Electronics Engineers |
Year | 1983 |
Languages | eng |
Description | 447 p. 28 cm |
Record date | 20110509 |
Location | New York |