Interferometric Metrology: 20-21 August 1987, San Diego, California

Shelfclass_id 6.F
Sortkey INTERFEROMETRIC
Authors Editor: N. A. Massie
Title Interferometric Metrology: 20-21 August 1987, San Diego, California
Publisher Society of photo-optical instrumentation engineers
Year 1988
Languages eng
Isbn 0892528516
Series Critical reviews of optical science and technology
Volume 816
Description vi, 239 p. 28 cm
Record date 20110706
Location Palos Verdes Estates, Calif.
Keywords Holographic interferometry, Congresses
Notes "Conference 816, Interferometric metrology, was part of a four-conference program on Precision Instrument Design held at SPIE's 31st annual International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering"--P. v.