Shelfclass_id |
6.F |
Sortkey |
INTERFEROMETRIC |
Authors |
Editor: N. A. Massie |
Title |
Interferometric Metrology: 20-21 August 1987, San Diego, California |
Publisher |
Society of photo-optical instrumentation engineers |
Year |
1988 |
Languages |
eng |
Isbn |
0892528516 |
Series |
Critical reviews of optical science and technology |
Volume |
816 |
Description |
vi, 239 p. 28 cm |
Record date |
20110706 |
Location |
Palos Verdes Estates, Calif. |
Keywords |
Holographic interferometry, Congresses |
Notes |
"Conference 816, Interferometric metrology, was part of a four-conference program on Precision Instrument Design held at SPIE's 31st annual International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering"--P. v. |