| Shelfclass_id | 6.C |
| Sortkey | CROUCH, ALFRED L |
| Authors | Alfred L. Crouch |
| Title | Design-for-Test for Digital IC's and Embedded Core Systems |
| Publisher | Prentice Hall |
| Year | c1999 |
| Languages | eng |
| Isbn | 0130848271 |
| Description | xxvii, 349 p. ill. 25 cm. + |
| Record date | 20060810 |
| Location | Upper Saddle River, NJ |
| Keywords | Digital integrated circuits, Electronic circuit design, Automatic test equipment, Embedded computer systems |