| Shelfclass_id | 6.C |
| Sortkey | CHAKRADHAR, SRIMAT T |
| Authors | Srimat T. Chakradhar, Vishwani D. Agrawal, Michael Lee Bushnell |
| Title | Neural Models and Algorithms for Digital Testing |
| Publisher | Kluwer Academic Publishers |
| Year | c1991 |
| Languages | eng |
| Isbn | 0792391659 |
| Series | The Kluwer international series in engineering and computer science. VLSI, Computer Architecture and Digital Signal Processing |
| Volume | 140 |
| Description | xii, 184 p. ill. 25 cm. |
| Record date | 20100115 |
| Location | Boston |
| Keywords | Logic circuits, Automatic test equipment, Digital integrated circuits |