| Shelfclass_id | 6.C |
| Sortkey | AGRAWAL, VISHWANI D |
| Authors | Vishwani D. Agrawal, Sharad C. Seth |
| Title | Test Generation for VLSI Chips |
| Publisher | IEEE Computer Society Press |
| Year | c1988 |
| Languages | eng |
| Isbn | 0818647868, 081868786X |
| Description | x, 401 p. ill. 29 cm. |
| Record date | 20091210 |
| Location | Washington, D.C. |
| Keywords | Integrated circuits, Automatic test equipment |
| Notes | "Computer Society order number 786." |