| Shelfclass_id | 6.B |
| Sortkey | JOHNSON, NOBLE M |
| Authors | Noble M. Johnson, Stephen G. Bishop, George D. Watkins |
| Title | Microscopic Identification of Electronic Defects in Semiconductors: Symposium held April 15-18, 1985, San Francisco, California, U.S.A. |
| Publisher | Materials Research Society |
| Year | 1985 |
| Languages | eng |
| Isbn | 0931837111 |
| Series | Materials Research Society Symposia Proceedings |
| Volume | 46 |
| Issn | 0272-9172 |
| Description | xv, 604 p. ill. 24 cm |
| Record date | 20101004 |
| Location | Pittsburgh, Pa. |
| Keywords | Semiconductors, Defects, Congresses, Microscopy |