| Shelfclass_id | 6.B |
| Sortkey | ISTFA |
| Authors | ASM International, International Society for Testing and Failure Analysis |
| Title | ISTFA 1982: Proceedings ISTFA 1982: International Symposium for Testing and Failure Analysis 1982: [electronic resource] :: 25-27 October 1982, San Jose, California, U.S.A. |
| Publisher | ATFA |
| Year | 1982 |
| Languages | eng |
| Series | ASM International |
| Issn | 0890-1740 |
| Description | xi, 363 p. 28 cm |
| Record date | 20110607 |
| Location | California, USA |
| Keywords | Microelectronics, Testing |