| Shelfclass_id | 6.B |
| Sortkey | ISTFA |
| Authors | ASM International, International Society for Testing and Failure Analysis |
| Title | ISTFA 1988: International Symposium for Testing and Failure Analysis: [electronic resource] :: 31 October-4 November 1988, Los Angeles, California, USA |
| Publisher | ASM International |
| Year | 1987 |
| Languages | eng |
| Isbn | 0871703521 |
| Series | ASM International |
| Issn | 0890-1740 |
| Description | xi, 447 p. 28 cm |
| Record date | 20110607 |
| Location | Materials Park, OH |
| Keywords | Microelectronics, Testing |