Shelfclass_id |
6.B |
Sortkey |
ISTFA |
Authors |
ASM International, International Society for Testing and Failure Analysis |
Title |
ISTFA 1986: Proceedings ISTFA 1986: International Symposium for Testing and Failure Analysis 1986: [electronic resource] :: 20-24 October 1986, Los Angeles, California, USA |
Publisher |
ASM International |
Year |
1986 |
Languages |
eng |
Isbn |
0871702363 |
Series |
ASM International |
Issn |
0890-1740 |
Description |
xiii, 327 p. 28 cm |
Record date |
20110607 |
Location |
Materials Park, OH |
Keywords |
Microelectronics, Testing |