Shelfclass_id | 6.B |
Sortkey | ISTFA |
Authors | ASM International, International Society for Testing and Failure Analysis |
Title | ISTFA 1987 V2: International Symposium for Testing and Failure Analysis 1987: Proceedings of the Advanced Materials Symposium: [electronic resource] :: 9-13 November, 1987, Los Angeles, California, USA |
Publisher | ASM International |
Year | 1987 |
Languages | eng |
Isbn | 0871703122 |
Series | ASM International |
Issn | 0890-1740 |
Description | xiii, 347 p. 28 cm |
Record date | 20110607 |
Location | Materials Park, OH |
Keywords | Microelectronics, Testing |