Shelfclass_id | 6.B |
Sortkey | ISTFA |
Authors | ASM International, International Society for Testing and Failure Analysis |
Title | ISTFA 1985: Proceedings ISTFA 1985: International Symposium for Testing and Failure Analysis 1985: [electronic resource] :: 21-23 October 1985, Long Beach, California, U.S.A. |
Publisher | ATFA |
Year | 1985 |
Languages | eng |
Series | ASM International |
Issn | 0890-1740 |
Description | xiv, 393 p. 28 cm |
Record date | 20110607 |
Location | California, USA |
Keywords | Microelectronics, Testing |