| Shelfclass_id | 6.B |
| Sortkey | ISTFA |
| Authors | ASM International, International Society for Testing and Failure Analysis |
| Title | ISTFA 1987 V1: International Symposium for Testing and Failure Analysis 1987: Proceedings of the Microelectronics Symposium: [electronic resource] :: 9-13 November, 1987, Los Angeles, California, USA |
| Publisher | ASM International |
| Year | 1987 |
| Languages | eng |
| Isbn | 0871703114 |
| Series | ASM International |
| Issn | 0890-1740 |
| Description | xi, 289 p. 28 cm |
| Record date | 20110607 |
| Location | Materials Park, OH |
| Keywords | Microelectronics, Testing |