Shelfclass_id | 6.B |
Sortkey | ISTFA |
Authors | ASM International, International Society for Testing and Failure Analysis |
Title | ISTFA 1983: Proceedings ISTFA 1983: International Symposium for Testing and Failure Analysis 1983: [electronic resource] :: 17-19 October 1983, Los Angeles, California, U.S.A. |
Publisher | ATFA |
Year | 1983 |
Languages | eng |
Series | ASM International |
Issn | 0890-1740 |
Description | x, 381 p. 28 cm |
Record date | 20110607 |
Location | California, USA |
Keywords | Microelectronics, Testing |