| Shelfclass_id | 6.B |
| Sortkey | BAUER, GÜNTHER |
| Authors | Günther Bauer, Wolfgang Richter |
| Title | Optical Characterization of Epitaxial Semiconductor Layers |
| Publisher | Springer Pub. Co. |
| Year | c1996 |
| Languages | eng |
| Isbn | 354059129X |
| Description | (hardcover: alk. paper) xiv, 427 p. ill. 24 cm. |
| Record date | 20061113 |
| Location | New York |
| Keywords | Semiconductors, Heterostructures, Epitaxy, Crystal growth |
| Notes | Gunther Bauer |