| Shelfclass_id | 6.A |
| Sortkey | TRS |
| Authors | Prepared by: Henry C. Rickers |
| Title | TRS 1978: Technical Reliability Study: Microcircuit Screening Effectiveness: TRS-1: 1978 |
| Publisher | IIT Research Institute |
| Year | 1978 |
| Languages | eng |
| Series | RAC, Reliability Analysis Center (U.S.). Technical Reliability Study |
| Volume | TRS-1 |
| Description | x, 104 p. 28 cm |
| Record date | 20110614 |
| Location | Griffiss Air Force Base, N.Y. |
| Keywords | Hybrid integrated circuits, Reliability |