| Shelfclass_id | 6.A |
| Sortkey | MDR |
| Authors | Prepared by: Kieron A. Dey, Wayne E. Turkowski |
| Title | MDR 18: Microcircuit Device Reliability: Memory/Digital LSI: MDR-18: Winter 1981/82 |
| Publisher | IIT Research Institute |
| Year | 1981 |
| Languages | eng |
| Series | Microcircuit Device Reliability |
| Volume | MDR-18 |
| Description | ix, 443 p. 28 cm |
| Record date | 20110614 |
| Location | Griffiss Air Force Base, N.Y. |
| Keywords | Hybrid integrated circuits, Reliability |