Shelfclass_id | 6.A |
Sortkey | MDR |
Authors | Prepared by: David B. Nicholls |
Title | MDR 12: Microcircuit Device Reliability: Digital Failure Rate Data: MDR-12: Summer 1979 |
Publisher | IIT Research Institute |
Year | 1979 |
Languages | eng |
Series | Microcircuit Device Reliability |
Volume | MDR-12 |
Description | xii, 416 p. 28 cm |
Record date | 20110614 |
Location | Griffiss Air Force Base, N.Y. |
Keywords | Hybrid integrated circuits, Reliability |