| Shelfclass_id | 6.A |
| Sortkey | MDR |
| Authors | Prepared by: Mark R. Klein, David B. Nicholls |
| Title | MDR 08: Microcircuit Device Reliability: Digital Failure Rate Data: MDR-8: 1978 |
| Publisher | IIT Research Institute |
| Year | 1978 |
| Languages | eng |
| Series | Microcircuit Device Reliability |
| Volume | MDR-8 |
| Description | ix, 344 p. 28 cm |
| Record date | 20110614 |
| Location | Griffiss Air Force Base, N.Y. |
| Keywords | Hybrid integrated circuits, Reliability |