| Shelfclass_id | 6.A |
| Sortkey | MDR |
| Authors | Prepared by: Gene A. Hommey, Thomas E. Paquette |
| Title | MDR 06: Microcircuit Device Reliability: Linear/Interface Data: MDR-6: Autumn 1977 |
| Publisher | IIT Research Institute |
| Year | 1977 |
| Languages | eng |
| Series | Microcircuit Device Reliability |
| Volume | MDR-6 |
| Description | x, 234 p. 28 cm |
| Record date | 20110614 |
| Location | Griffiss Air Force Base, N.Y. |
| Keywords | Hybrid integrated circuits, Reliability |